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Name HAYASHI Masahiro
Official Title Associate Professor
Affiliation Electrical, Electronics and Communication Engineering
E-mail mhaya@tcu.ac.jp
Web
  1. https://researchmap.jp/7000004256/?lang=en
Profile Masahiro Hayashi was born in Anan City, Tokushima Prefecture, Japan, in 1962. He received the B. S. degree in mathematics in 1986 and the Ph. D degree in reliability engineering in 1995, both from Nagoya University, Japan.
He joined NTT Laboratories in 1986 and has been researching network reliability evaluation and design before becoming a manger of NTT Advanced Technology Corp. at 1996. He came back to NTT Laboratires from 1997 as a senior research engineer. He became an associate professor at Tokyo City University at 2011, his current position.
Research Field(Keyword & Summary)
  1. Reliability, Graph theory, Secrity, Encryption

    He is interested in how to realize high relieble and high secure newtork with reasonable cost. His approeches are based on two, one is graph theoretical approach and the other is encryption. He evaluate reliabiilty of network by reperseting it to a graph with reliability measure being defind as the probability of connection between specifed nodes. His encrytpion is applied for secret computation to obtain computing result witout revealing paramters used in its computation.
Representative Papers
  1. Masahiro Hayashi, “Effect of failures on stock price of telecommunication service providers”, IEICE Transaction vol. E104-B, no. 7, pp. 829－836, July 2021.
  2. Junpei Aramata and Masahiro Hayashi, “A faster method for exactly evaluating one-to-all reliabilities of telecommunications networks, IEEJ Transaction on Electrical and Electronic Engineering, vol. 12, no. 3, pp. 420-427, May 2017.
  3. M. Hayashi and Hisao Yamamoto, “A new method of approximation for computing system failure frequency, Journal of the Operations Research Society of Japan, vol. 59, no. 3, pp. 258-208, July 2016.
  4. Masahiro Hayashi and Takeo Abe, “Efficient reliability approximation method for traffic-path-based network, IEEE Transaction on Reliability, vol. R-60, no. 2, pp. 460-469, June 2011.
  5. Masahiro Hayashi, “Effects of reliability measure on market share”, IEICE Transaction on Fundamentals of Electronics, Communications and Computer Sciences”, vol. E94-A, no. 10, pp. 2043-2047, Aug. 2011.
  6. Masahiro Hayashi, Takeo Abe and Isami Nakajima, “Transformation from availability expression to failure frequency expression”, IEEE Transaction on Reliability, vol. R-55, no. 2, pp. 252-261, June 2006.
  7. Masahiro Hayashi, Takeo Abe and Isami Nakajima, “Transformation from availability expression to failure frequency expression”, IEEE Transaction on Reliability, vol. R-55, no. 2, pp. 252-261, June 2006.
  8. Takeo Abe, Masahiro Hayashi and Satoshi Nojo, “A software tool to support the reliability design and evaluation of telecommunication networks“ Journal on Selected Area in Communication, vol. 12, no. 2, pp. 345-354, February 1994.
  9. Yasuyoshi Okada and Masahiro Hayashi, “Graph rewriting system and their applications to network reliability analysis”, IEICE Transaction on Information and Systems, vol. E76-D, no. 2, pp. 154-162, February 1993.
  10. Masahiro Hayashi, “system failure frequency analysis using a differential operator, IEEE Transaction on Reliability, vol. R-40, no. 5, pp. 601-609, December 1991.
Patent
  1. Regustration numbers: 4558768, 4205566, 4021804, 3895700, 3241969
Award NTT Laboratories' director's Award 1992, System Technology Award from The Telecommunications Advancement Foundation (Japan) 2013, Distingushied Service Award from Technical Committee from Communication Quality 2014
Grant-in-Aid for Scientific Research Support: Japan Society for Promotion of Science (JSPS) https://nrid.nii.ac.jp/ja/nrid/1000030611553/
Research Grants/Projects including subsidies, donations, grants, etc. Grant for presentation at conference, NEC C&C Founadtion, Jan, 2017 - Feb, 2017
Grant for Okawa Telecom. Fundation 2011
Affiliated academic society (Membership type) IEICE Senior member, IEEE Senior member, Japan Society for th Comparative Study of Civilization member
Education Field (Undergraduate level) Statisitics, Logical Circuit, Reliability Theory, Security
Education Field (Graduate level) Reliability Theory

Affiliation