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Name SHIBA Masataka
Official Title Professor
Affiliation Intelligent Systems, Information Technology
E-mail mshiba@tcu.ac.jp
Profile He graduated from Tokyo University and received BS and MS degrees in the field of Precision Machinery Engineering. In 1980, he joined Hitachi, Ltd. At Production Engineering Res. Lab. he developed production and inspection systems for semiconductor production using optics, coordinated international research project and directed factory automation team. In 2000, he moved to Hitachi Displays, Ltd., where he directed supply chain management, code system renovation and big bang (SAP introduction) projects as well as business strategy building and business process innovation. 1n 2005, he returned to Hitachi, Ltd. and as CIO for Europe or GM of corporate IT strategy division, he directed global IT governance scheme building and Hitachi Group code consolidation project. In 2014, he moved to Hitachi Capital Corporation, where he rebuilt its company’s global IT governance scheme remarkably. In 2016, he launched now consulting company called CM-PASS. The main concerns of this company was how to improve global governance and communication between HQ in Japan and its group companies outside Japan. His analysis and logical explanation skills can change Japanese’s “Tacit knowledge” to the “Explicit one”.
Since 2020, he is a professor at Tokyo City Universy. Taking advantage of his diverse and abundant experience in companies, he started research activities in the field of intelligent management systems.
Research Field(Keyword & Summary)
  1. (1) Social issue solving

    This research aim to explore the root causes of social issues that exist in our daily lives from a bird's-eye view and to find rational solutions to them.

  2. (2) Global governance scheme building

    In order to promote the globalization of companies, it is necessary to build an effective governance scheme even when the cultures of each country and the way of thinking of employees are different. In the laboratory, what kind of measures should be taken for that purpose is considered.
Representative Papers
  1. (1) Study on Wafer Inclination Measurement Technique using Linear Grating Coupler, Journal of the Japan Society for Precision Engineering 1995, Vol 61, No. 6 P859-864 (Japanese Language)
  2. (2) Automatic inspection of contaminants on reticles, Proceedings of SPIE, Optical Microlithography III, 1984, Vol. 470, P233-239
  3. (3) Relative alignment by direct wafer detection utilizing rocking illumination of Ar ion laser, Proceedings of SPIE, Optical Microlithography V, 1986, Vol. 633, P72-78
Award JSPE Award (1995)
Recruitment of research assistant(s) No
Affiliated academic society (Membership type) The Japan Society for Precision Engineering [JSPE]
Education Field (Undergraduate level) Global Enterprise Management, Career Design for Professionals, Intellectual Property Management

Affiliation